This journal presents original research that describes novel pattern analysis techniques as well as industrial and medical applications. It details new technology and methods for pattern recognition and analysis in applied domains, including computer vision and image processing, speech analysis, robotics, multimedia, document analysis, character recognition, knowledge engineering for pattern recognition, fractal analysis, and intelligent control.
Pattern Analysis and Applications (PAA) also examines the use of advanced methods, including statistical techniques, neural networks, genetic algorithms, fuzzy pattern recognition, machine learning, and hardware implementations which are either relevant to the development of pattern analysis as a research area or detail novel pattern analysis applications.
The journal contains case-studies as well as reviews on benchmarks, evaluations of tools, and important research activities at international centers of excellence.
For all submission-related enquiries, please contact the Journal Editorial Office via “Contacts” or the Senior Editor Dragos Calitoiu at email@example.com.
- Describes novel pattern analysis techniques as well as industrial and medical applications.
- Details new technology and methods for pattern recognition and analysis in applied domains.
- Examines the use of advanced methods
- Contains case-studies as well as reviews on benchmarks, evaluations of tools, and important research activities at international centers of excellence.
- Sameer Singh
- Publishing model
- Hybrid. Open Access options available
- 1.41 (2018)
- Impact factor
- 1.436 (2018)
- Five year impact factor
- 136 days
- Submission to first decision
- 402 days
- Submission to acceptance
- 71,435 (2018)
Authors (first, second and last of 4)
Guest Editors: Sergio Escalera, Cristina Palmero, Maria Inés Torres, Anna Esposito, Alexa Moseguí Saladié
Submission deadline: 1 July 2020
About this journal
- Electronic ISSN
- Print ISSN
- Abstracted and indexed in
- ACM Digital Library
- Current Contents/Engineering, Computing and Technology
- EBSCO Academic Search
- EBSCO Applied Science & Technology Source
- EBSCO Computer Science Index
- EBSCO Computers & Applied Sciences Complete
- EBSCO Discovery Service
- EBSCO Engineering Source
- EBSCO STM Source
- Gale Academic OneFile
- Gale InfoTrac
- Google Scholar
- Institute of Scientific and Technical Information of China
- Journal Citation Reports/Science Edition
- Mathematical Reviews
- OCLC WorldCat Discovery Service
- ProQuest Advanced Technologies & Aerospace Database
- ProQuest Central
- ProQuest SciTech Premium Collection
- ProQuest Technology Collection
- ProQuest-ExLibris Primo
- ProQuest-ExLibris Summon
- Science Citation Index Expanded (SciSearch)