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Communications in Computer and Information Science

VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

Editors: Kaushik, Brajesh Kumar, Dasgupta, Sudeb, Singh, Virendra (Eds.)

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eBook 91,62 €
price for India (gross)
  • ISBN 978-981-10-7470-7
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover 108,00 €
price for India (gross)
  • ISBN 978-981-10-7469-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Table of contents (42 chapters)

  • Flexible Composite Galois Field $$GF((2^m)^2)$$ Multiplier Designs

    Mohamed Asan Basiri, M. (et al.)

    Pages 3-14

    Preview Buy Chapter 24,95 €
  • Estimating the Maximum Propagation Delay of 4-bit Ripple Carry Adder Using Reduced Input Transitions

    Mewada, Manan (et al.)

    Pages 15-23

  • VLSI Implementation of Throughput Efficient Distributed Arithmetic Based LMS Adaptive Filter

    Khan, Mohd. Tasleem (et al.)

    Pages 24-35

    Preview Buy Chapter 24,95 €
  • Realization of Multiplier Using Delay Efficient Cyclic Redundant Adder

    Dheepika, K. (et al.)

    Pages 36-47

    Preview Buy Chapter 24,95 €
  • Fast Architecture of Modular Inversion Using Itoh-Tsujii Algorithm

    Zode, Pravin (et al.)

    Pages 48-55

    Preview Buy Chapter 24,95 €

Buy this book

eBook 91,62 €
price for India (gross)
  • ISBN 978-981-10-7470-7
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover 108,00 €
price for India (gross)
  • ISBN 978-981-10-7469-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
VLSI Design and Test
Book Subtitle
21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Editors
  • Brajesh Kumar Kaushik
  • Sudeb Dasgupta
  • Virendra Singh
Series Title
Communications in Computer and Information Science
Series Volume
711
Copyright
2017
Publisher
Springer Singapore
Copyright Holder
Springer Nature Singapore Pte Ltd.
eBook ISBN
978-981-10-7470-7
DOI
10.1007/978-981-10-7470-7
Softcover ISBN
978-981-10-7469-1
Series ISSN
1865-0929
Edition Number
1
Number of Pages
XXI, 815
Number of Illustrations and Tables
486 b/w illustrations
Topics