Infosys Science Foundation Series in Mathematical Sciences

Software Reliability Growth Models

Authors: Hanagal, David D., Bhalerao, Nileema N.

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  • Discusses the basic concepts of software reliability growth models 
  • Explains different non-homogeneous Poisson process of software reliability models
  • Presents applications in artificial neural networks, machine learning, and artificial intelligence   
  • Appeals to practitioners, researchers, and students who need information on software reliability engineering
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eBook 106,99 €
price for Spain (gross)
  • ISBN 978-981-16-0025-8
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Hardcover 135,19 €
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  • ISBN 978-981-16-0024-1
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  • Covid-19 shipping restrictions
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About this book

This book presents the basic concepts of software reliability growth models (SRGMs), ranging from fundamental to advanced level. It discusses SRGM based on the non-homogeneous Poisson process (NHPP), which has been a quite successful tool in practical software reliability engineering. These models consider the debugging process as a counting process characterized by its mean value function. Model parameters have been estimated by using either the maximum likelihood method or regression. NHPP SRGMs based on inverse Weibull, generalized inverse Weibull, extended inverse Weibull, generalized extended inverse Weibull, and delayed S-shaped have been focused upon.  Review of literature on SRGM has been included from the scratch to recent developments, applicable in artificial neural networks, machine learning, artificial intelligence, data-driven approaches, fault-detection, fault-correction processes, and also in random environmental conditions. This book is designed for practitioners and researchers at all levels of competency, and also targets groups who need information on software reliability engineering.

About the authors

David D. Hanagal is Honorary Professor at Symbiosis Statistical Institute, Symbiosis International University, Pune, India. He was previously Professor at the Department of Statistics, Savitribai Phule Pune University, India. He is an elected fellow of the Royal Statistical Society, UK. He has authored three books and three book chapters and published over 130 research publications in leading international refereed journals. He has guided 9 Ph.D. students in different areas of statistics, namely reliability, survival analysis, frailty models, repair and replacement models, software reliability, and quality loss index. He also has worked as Visiting Professor at several universities in the USA, Germany, and Mexico, and delivered more than 100 invited talks in many national and international platforms of repute worldwide.
He is Editor-in-Chief, Associate Editor, and an editorial board member of several reputed national and international journals. He is the chairperson, the subject expert, and an advisory committee member on several UGC committees. He is a National Assessment and Accreditation Council (NAAC) Assessor from UGC. He is the subject expert (statistics) in board of studies committee of several universities. He is a governing council member, an executive council member, and a life member of several statistical societies, organizations, and associations. His research interests include statistical inference, selection problems, reliability, survival analysis, frailty models, Bayesian inference, stress–strength models, Monte–Carlo methods, MCMC algorithms, bootstrapping, censoring schemes, distribution theory, multivariate models, characterizations, repair and replacement models, software reliability, quality loss index, and nonparametric inference. With more than 40 years of teaching experience and more than 35 years of research experience, he is an expert on writing programs using SAS, R, MATLAB, MINITAB, SPSS, and SPLUS statistical packages.
Nileema N. Bhalerao is Assistant Professor at Fergusson College, Pune, India. With 20 years of teaching experience and 5 years of research experience, she is an expert on writing programs using several statistical packages. Her research interest includes software reliability models.

Table of contents (9 chapters)

Table of contents (9 chapters)

Buy this book

eBook 106,99 €
price for Spain (gross)
  • ISBN 978-981-16-0025-8
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 135,19 €
price for Spain (gross)
  • ISBN 978-981-16-0024-1
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Software Reliability Growth Models
Authors
Series Title
Infosys Science Foundation Series in Mathematical Sciences
Copyright
2021
Publisher
Springer Singapore
Copyright Holder
The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.
eBook ISBN
978-981-16-0025-8
DOI
10.1007/978-981-16-0025-8
Hardcover ISBN
978-981-16-0024-1
Series ISSN
2364-4036
Edition Number
1
Number of Pages
XXI, 104
Number of Illustrations
40 b/w illustrations
Topics