Arbeiten zur Angewandten Statistik

Adaptive Bayes’sche Stichprobensysteme für die Gut-Schlecht-Prüfung

Authors: Rendtel, Ulrich, Lenz, Hans-Joachim

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  • ISBN 978-3-662-11027-0
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  • ISBN 978-3-7908-0468-3
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Table of contents (10 chapters)

Table of contents (10 chapters)

Buy this book

eBook 42,99 €
price for Spain (gross)
  • ISBN 978-3-662-11027-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover 53,45 €
price for Spain (gross)
  • ISBN 978-3-7908-0468-3
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions & severe weather in the US may cause delays
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Adaptive Bayes’sche Stichprobensysteme für die Gut-Schlecht-Prüfung
Authors
Series Title
Arbeiten zur Angewandten Statistik
Series Volume
33
Copyright
1990
Publisher
Physica-Verlag Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-662-11027-0
DOI
10.1007/978-3-662-11027-0
Softcover ISBN
978-3-7908-0468-3
Series ISSN
0066-5673
Edition Number
1
Number of Pages
IX, 231
Topics