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  • © 1986

EXAFS: Basic Principles and Data Analysis

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Part of the book series: Inorganic Chemistry Concepts (INORGANIC, volume 9)

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Table of contents (8 chapters)

  1. Front Matter

    Pages I-XVIII
  2. X-Rays and Electrons

    • Boon K. Teo
    Pages 1-20
  3. EXAFS Parameters

    • Boon K. Teo
    Pages 34-52
  4. Theory of EXAFS

    • Boon K. Teo
    Pages 53-78
  5. Improvement of EXAFS Theory

    • Boon K. Teo
    Pages 79-113
  6. Data Analysis in Practice

    • Boon K. Teo
    Pages 114-157
  7. Theoretical Amplitude and Phase Functions

    • Boon K. Teo
    Pages 158-182
  8. Back Matter

    Pages 223-349

About this book

The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners.

Authors and Affiliations

  • Bell Laboratories, AT & T, Murray Hill, USA

    Boon K. Teo

Bibliographic Information

Buy it now

Buying options

eBook USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access