Kelvin Probe Force Microscopy
Measuring and Compensating Electrostatic Forces
Editors: Sadewasser, Sascha, Glatzel, Thilo (Eds.)
Free Preview- First book dedicated soley to Kelvin force microscopy
- Explains basics, realization, modulation and data interpretation
- Provides important application examples
- Useful reference to researchers and graduate students alike
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- About this book
-
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
- Table of contents (13 chapters)
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Introduction
Pages 1-3
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Experimental Technique and Working Modes
Pages 7-24
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Capacitive Crosstalk in AM-Mode KPFM
Pages 25-44
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The Effect of the Measuring Tip and Image Reconstruction
Pages 45-67
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Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale
Pages 69-97
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Table of contents (13 chapters)
- Download Preface 1 PDF (61.3 KB)
- Download Sample pages 1 PDF (435.5 KB)
- Download Table of contents PDF (63.5 KB)
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Bibliographic Information
- Bibliographic Information
-
- Book Title
- Kelvin Probe Force Microscopy
- Book Subtitle
- Measuring and Compensating Electrostatic Forces
- Editors
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- Sascha Sadewasser
- Thilo Glatzel
- Series Title
- Springer Series in Surface Sciences
- Series Volume
- 48
- Copyright
- 2012
- Publisher
- Springer-Verlag Berlin Heidelberg
- Copyright Holder
- Springer-Verlag Berlin Heidelberg
- eBook ISBN
- 978-3-642-22566-6
- DOI
- 10.1007/978-3-642-22566-6
- Hardcover ISBN
- 978-3-642-22565-9
- Softcover ISBN
- 978-3-642-27113-7
- Series ISSN
- 0931-5195
- Edition Number
- 1
- Number of Pages
- XIV, 334
- Topics
