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Engineering Materials

Transport in Metal-Oxide-Semiconductor Structures

Mobile Ions Effects on the Oxide Properties

Authors: Bentarzi, Hamid

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  • Reviews state-of-the-art in the field
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  • Improves the understanding of transport phenomena
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eBook 91,62 €
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  • ISBN 978-3-642-16304-3
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Hardcover 124,79 €
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  • ISBN 978-3-642-16303-6
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Softcover 114,39 €
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  • ISBN 978-3-642-26688-1
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About this book

This book focuses on the importance of mobile ions presented in oxide structures, what significantly affects the metal-oxide-semiconductor (MOS) properties. The reading starts with the definition of the MOS structure, its various aspects and different types of charges presented in their structure. A review on ionic transport mechanisms and techniques for measuring the mobile ions concentration in the oxides is given, special attention being attempted to the Charge Pumping (CP) technique associated with the Bias Thermal Stress (BTS) method. Theoretical approaches to determine the density of mobile ions as well as their distribution along the oxide thickness are also discussed. The content varies from general to very specific examples, helping the reader to learn more about transport in MOS structures.

Table of contents (7 chapters)

Table of contents (7 chapters)

Buy this book

eBook 91,62 €
price for Spain (gross)
  • ISBN 978-3-642-16304-3
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 124,79 €
price for Spain (gross)
  • ISBN 978-3-642-16303-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 114,39 €
price for Spain (gross)
  • ISBN 978-3-642-26688-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Transport in Metal-Oxide-Semiconductor Structures
Book Subtitle
Mobile Ions Effects on the Oxide Properties
Authors
Series Title
Engineering Materials
Copyright
2011
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-16304-3
DOI
10.1007/978-3-642-16304-3
Hardcover ISBN
978-3-642-16303-6
Softcover ISBN
978-3-642-26688-1
Series ISSN
1612-1317
Edition Number
1
Number of Pages
XIV, 106
Topics