Applied Scanning Probe Methods XI
Scanning Probe Microscopy Techniques
Editors: Bhushan, Bharat, Fuchs, Harald (Eds.)
Free Preview- First book summarizing the state-of-the-art of this technique
- Real industrial applications included
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- Reviews
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From the reviews:
"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. … The editors and their talented authors have been among the leaders in the study of probe methods. … Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. … All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)
“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications … . well-written and clearly illustrated. … contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)
- Table of contents (8 chapters)
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Oscillation Control in Dynamic SPM with Quartz Sensors
Pages 1-16
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Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation
Pages 17-38
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Mechanical Diode-Based Ultrasonic Atomic Force Microscopies
Pages 39-71
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Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science
Pages 73-95
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Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements
Pages 97-138
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Table of contents (8 chapters)
- Download Preface 1 PDF (42.7 KB)
- Download Sample pages 1 PDF (1.3 MB)
- Download Table of contents PDF (279.8 KB)
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Bibliographic Information
- Bibliographic Information
-
- Book Title
- Applied Scanning Probe Methods XI
- Book Subtitle
- Scanning Probe Microscopy Techniques
- Editors
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- Bharat Bhushan
- Harald Fuchs
- Series Title
- NanoScience and Technology
- Copyright
- 2009
- Publisher
- Springer-Verlag Berlin Heidelberg
- Copyright Holder
- Springer-Verlag Berlin Heidelberg
- eBook ISBN
- 978-3-540-85037-3
- DOI
- 10.1007/978-3-540-85037-3
- Hardcover ISBN
- 978-3-540-85036-6
- Softcover ISBN
- 978-3-642-09869-7
- Series ISSN
- 1434-4904
- Edition Number
- 1
- Number of Pages
- LVI, 236
- Number of Illustrations
- 91 b/w illustrations, 22 illustrations in colour
- Topics
