Springer Proceedings in Physics

Microscopy of Semiconducting Materials

Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Editors: Cullis, A.G., Hutchison, John L. (Eds.)

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About this book

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.

Table of contents (45 chapters)

Table of contents (45 chapters)
  • Structural properties of GaN quantum dots

    Daudin, B (et al.)

    Pages 3-12

  • Stranski-Krastanov growth for InGaN/GaN: wetting layer thickness changes

    Laak, N K (et al.)

    Pages 13-16

  • Investigation of InxGa1−x N islands with electron microscopy

    Pretorius, A (et al.)

    Pages 17-20

  • First stage of nucleation of GaN on (0001) sapphire

    Kwon, Y B (et al.)

    Pages 21-24

  • In GaN-GaN quantum wells: their luminescent and nano-structural properties

    Barnard, J S (et al.)

    Pages 25-28

Buy this book

eBook 214,19 €
price for Spain (gross)
  • ISBN 978-3-540-31915-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 291,19 €
price for Spain (gross)
  • ISBN 978-3-540-31914-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 272,14 €
price for Spain (gross)
  • ISBN 978-3-642-06870-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Microscopy of Semiconducting Materials
Book Subtitle
Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
Editors
  • A.G. Cullis
  • John L. Hutchison
Series Title
Springer Proceedings in Physics
Series Volume
107
Copyright
2005
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-31915-3
DOI
10.1007/3-540-31915-8
Hardcover ISBN
978-3-540-31914-6
Softcover ISBN
978-3-642-06870-6
Series ISSN
0930-8989
Edition Number
1
Number of Pages
XVI, 540
Topics