Springer Tracts in Modern Physics

Infrared Ellipsometry on Semiconductor Layer Structures

Phonons, Plasmons, and Polaritons

Authors: Schubert, Mathias

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About this book

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.

A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

Table of contents (14 chapters)

Table of contents (14 chapters)

Buy this book

eBook 171,19 €
price for Spain (gross)
  • The eBook version of this title will be available soon
  • ISBN 978-3-540-44701-6
  • Digitally watermarked, DRM-free
  • Included format:
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 228,79 €
price for Spain (gross)
  • ISBN 978-3-540-23249-0
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 213,81 €
price for Spain (gross)
  • ISBN 978-3-642-06228-5
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Infrared Ellipsometry on Semiconductor Layer Structures
Book Subtitle
Phonons, Plasmons, and Polaritons
Authors
Series Title
Springer Tracts in Modern Physics
Series Volume
209
Copyright
2004
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-44701-6
DOI
10.1007/b11964
Hardcover ISBN
978-3-540-23249-0
Softcover ISBN
978-3-642-06228-5
Series ISSN
0081-3869
Edition Number
1
Number of Pages
XI, 196
Topics