Overview
- Gives a state-of-the-art report on the science and technology of functional materials and thin films
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 58)
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Keywords
- Boundary element method
- Computational methods
- Convergent beam electron diffraction
- Ferroelectric thin films
- MOCVD
About this book
Editors and Affiliations
Bibliographic Information
Book Title: Functional Thin Films and Functional Materials
Book Subtitle: New Concepts and Technologies
Editors: Donglu Shi
Series Title: Springer Series in Materials Science
Publisher: Springer Berlin, Heidelberg
Copyright Information: Springer-Verlag Berlin Heidelberg 2003
Hardcover ISBN: 978-3-540-00111-9Published: 26 September 2003
Softcover ISBN: 978-3-642-05513-3Published: 15 December 2010
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XVI, 444
Additional Information: Jointly published with Tsinghua University Press, Beijing, China