Springer Series in Optical Sciences

Spectroscopic Ellipsometry for Photovoltaics

Volume 2: Applications and Optical Data of Solar Cell Materials

Editors: Fujiwara, Hiroyuki, Collins, Robert W. (Eds.)

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  • Presents the ellipsometry characterization of solar cell materials/devices 
  • Provides easy-to-follow explanations of ellipsometry data analysis 
  • Includes optical constants for all solar cell component layers 
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eBook 118,99 €
price for Spain (gross)
  • ISBN 978-3-319-95138-6
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Hardcover 155,99 €
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  • ISBN 978-3-319-95137-9
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About this book

Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.

About the authors

Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a  professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University. 

Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.

Table of contents (13 chapters)

Table of contents (13 chapters)

Buy this book

eBook 118,99 €
price for Spain (gross)
  • ISBN 978-3-319-95138-6
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 155,99 €
price for Spain (gross)
  • ISBN 978-3-319-95137-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Spectroscopic Ellipsometry for Photovoltaics
Book Subtitle
Volume 2: Applications and Optical Data of Solar Cell Materials
Editors
  • Hiroyuki Fujiwara
  • Robert W. Collins
Series Title
Springer Series in Optical Sciences
Series Volume
214
Copyright
2018
Publisher
Springer International Publishing
Copyright Holder
Springer Nature Switzerland AG
eBook ISBN
978-3-319-95138-6
DOI
10.1007/978-3-319-95138-6
Hardcover ISBN
978-3-319-95137-9
Series ISSN
0342-4111
Edition Number
1
Number of Pages
XXI, 616
Number of Illustrations
126 b/w illustrations, 204 illustrations in colour
Topics