Springer Series in Optical Sciences

Spectroscopic Ellipsometry for Photovoltaics

Volume 1: Fundamental Principles and Solar Cell Characterization

Editors: Fujiwara, Hiroyuki, Collins, Robert W. (Eds.)

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  • Presents ellipsometry characterization of solar cell materials/devices
  • Provides easy-to-understand explanations of ellipsometry data analysis
  • Includes optical constants for all solar-cell component layers
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eBook 178,49 €
price for Spain (gross)
  • ISBN 978-3-319-75377-5
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Hardcover 228,79 €
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  • ISBN 978-3-319-75375-1
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  • Usually dispatched within 3 to 5 business days.
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About this book

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.


About the authors

Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a  professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University. 

Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.

Table of contents (19 chapters)

Table of contents (19 chapters)

Buy this book

eBook 178,49 €
price for Spain (gross)
  • ISBN 978-3-319-75377-5
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 228,79 €
price for Spain (gross)
  • ISBN 978-3-319-75375-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Spectroscopic Ellipsometry for Photovoltaics
Book Subtitle
Volume 1: Fundamental Principles and Solar Cell Characterization
Editors
  • Hiroyuki Fujiwara
  • Robert W. Collins
Series Title
Springer Series in Optical Sciences
Series Volume
212
Copyright
2018
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing AG, part of Springer Nature
eBook ISBN
978-3-319-75377-5
DOI
10.1007/978-3-319-75377-5
Hardcover ISBN
978-3-319-75375-1
Series ISSN
0342-4111
Edition Number
1
Number of Pages
XX, 594
Number of Illustrations
70 b/w illustrations, 266 illustrations in colour
Topics