Outlook and Challenges of Nano Devices, Sensors, and MEMS

Editors: Li, Ting, Liu, Zhiwei (Eds.)

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  • Explains the interaction of nanascale structures and electrical and/or optical behavior of novel semiconductor devices, MEMS, and sensors
  • Describes processes and materials needed to fabricate the nano devices discussed
  • Discusses design, modeling and simulation for optimizing the performance of nanoscale devices
  • Examines the effect of nanoscale structures on the reliability of nano devices
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eBook 142,79 €
price for Spain (gross)
  • ISBN 978-3-319-50824-5
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 176,79 €
price for Spain (gross)
  • ISBN 978-3-319-50822-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 176,79 €
price for Spain (gross)
  • ISBN 978-3-319-84500-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
About this book

This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrical and/or optical performance, how to find optimal solutions to achieve the best outcome, how these apparatus can be designed via models and simulations, how to improve reliability, and what are the possible challenges and roadblocks moving forward.

About the authors

Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF), Orlando, Florida where he is now the Pegasus Distinguished Professor, Lockheed Martin St. Laurent Professor, and UCF-Analog Devices Fellow. His current research interests are Micro/nanoelectronics computer-aided design, RF device modeling and simulation, and electrostatic discharge (ESD) protection design, modeling and simulation. Dr. Liou holds 8 U.S. patents (3 more filed and pending), and has published 9 books, more than 260 journal papers (including 17 invited review articles), and more than 210 papers (including 90 keynote and invited papers) in international and national conference proceedings.

Table of contents (17 chapters)

Table of contents (17 chapters)

Buy this book

eBook 142,79 €
price for Spain (gross)
  • ISBN 978-3-319-50824-5
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 176,79 €
price for Spain (gross)
  • ISBN 978-3-319-50822-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 176,79 €
price for Spain (gross)
  • ISBN 978-3-319-84500-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Outlook and Challenges of Nano Devices, Sensors, and MEMS
Editors
  • Ting Li
  • Zhiwei Liu
Copyright
2017
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing AG
eBook ISBN
978-3-319-50824-5
DOI
10.1007/978-3-319-50824-5
Hardcover ISBN
978-3-319-50822-1
Softcover ISBN
978-3-319-84500-5
Edition Number
1
Number of Pages
XVI, 521
Number of Illustrations
95 b/w illustrations, 272 illustrations in colour
Topics