Editors:
- Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy
- Deals with the various classes of materials studied at the atomic scale
- A valuable reference for researchers as well as a text for graduate students
- Written by leading researchers in the field
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (22 chapters)
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Front Matter
About this book
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
Editors and Affiliations
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Institute of Scientific and Industrial Research, Osaka University Nanoscience and Nanotechnology Center, Osaka, Japan
Seizo Morita
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Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany
Franz J. Giessibl
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Department of Physics, University of Basel, Basel, Switzerland
Ernst Meyer
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ERC Advanced Research Group "FURORE", University of Hamburg, Hamburg, Germany
Roland Wiesendanger
Bibliographic Information
Book Title: Noncontact Atomic Force Microscopy
Book Subtitle: Volume 3
Editors: Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-319-15588-3
Publisher: Springer Cham
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer International Publishing Switzerland 2015
Hardcover ISBN: 978-3-319-15587-6Published: 02 June 2015
Softcover ISBN: 978-3-319-35876-5Published: 13 October 2016
eBook ISBN: 978-3-319-15588-3Published: 18 May 2015
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XXII, 527
Number of Illustrations: 97 b/w illustrations, 159 illustrations in colour
Topics: Nanoscale Science and Technology, Surfaces and Interfaces, Thin Films, Spectroscopy and Microscopy, Nanotechnology