Overview
- Provides the most practical, up-to-date and critical review of atom probe microscopy techniques
- Presents a detailed description of the analysis tools
- Includes practical examples of how the technique can be used in materials science research
- Stands as a must-have reference for any user of atom probe microscopy
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 160)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (10 chapters)
-
Fundamentals
-
Applying atom probe techniques for materials science
Keywords
- Atom probe data analysis
- Atom probe data quality
- Atom probe microscopy book
- Atom probe microscopy materials science
- Atom probe microscopy specimen preparation
- Atom probe tomography
- Experimental protocols, atom probe microscopy
- Field desorption
- Field evaporation
- Field ion microscopy
- Tomographic reconstruction
About this book
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.
Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Reviews
“Atom Probe Microscopy … provides a much needed update on the topic and introduces the broader scientific community to this developing technique. … this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active practitioners. The balanced delivery of instructional and reference material, in tandem with excellent graphical examples, make this book a flexible text for any atom probe laboratory.” (Daniel K. Schreiber, Analytical and Bioanalytical Chemistry, Vol.407, 2015)
Authors and Affiliations
Bibliographic Information
Book Title: Atom Probe Microscopy
Authors: Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-1-4614-3436-8
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media, LLC 2012
Hardcover ISBN: 978-1-4614-3435-1Published: 14 May 2012
Softcover ISBN: 978-1-4899-8939-0Published: 11 June 2014
eBook ISBN: 978-1-4614-3436-8Published: 27 August 2012
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XXIV, 396
Topics: Characterization and Evaluation of Materials, Nanoscale Science and Technology, Nanochemistry, Spectroscopy and Microscopy, Nanotechnology