X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology
Editors: Shackley, M. Steven (Ed.)
Free Preview- No other volume examining recently technological advances of XRF for archaeological uses.
- Contributors are archaeologists, geologists, chemists and physicists
- Provides invaluable guidance to the technology, pertinent for those working at historically or culturally sensitive sites where non-destructive analysis of archaeological materials is imperative
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- About this Textbook
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Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come.
Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide.
The contributors to this volume are at the forefront of the newest applications of XRF to archaeological solutions. It covers all relevant aspects of the field for those using the newest XRF technologies.
- About the authors
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M. Steven Shackley is Professor of Anthropology and Director of the Berkeley Archaeological XRF Laboratory at the University of California, Berkeley.
- Table of contents (10 chapters)
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X-Ray Fluorescence Spectrometry in Twenty-First Century Archaeology
Pages 1-6
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An Introduction to X-Ray Fluorescence (XRF) Analysis in Archaeology
Pages 7-44
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Factors Affecting the Energy-Dispersive X-Ray Fluorescence (EDXRF) Analysis of Archaeological Obsidian
Pages 45-63
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Non-destructive EDXRF Analyses of Archaeological Basalts
Pages 65-79
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Non-destructive Applications of Wavelength XRF in Obsidian Studies
Pages 81-107
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Table of contents (10 chapters)
- Download Preface 1 PDF (32 KB)
- Download Sample pages 1 PDF (607.9 KB)
- Download Table of contents PDF (22.9 KB)
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Bibliographic Information
- Bibliographic Information
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- Book Title
- X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology
- Editors
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- M. Steven Shackley
- Copyright
- 2011
- Publisher
- Springer-Verlag New York
- Copyright Holder
- Springer Science+Business Media, LLC
- eBook ISBN
- 978-1-4419-6886-9
- DOI
- 10.1007/978-1-4419-6886-9
- Hardcover ISBN
- 978-1-4419-6885-2
- Softcover ISBN
- 978-1-4614-3620-1
- Edition Number
- 1
- Number of Pages
- XIV, 231
- Number of Illustrations
- 21 b/w illustrations, 11 illustrations in colour
- Topics
