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Lecture Notes in Electrical Engineering

Functional Design Errors in Digital Circuits

Diagnosis Correction and Repair

Authors: Chang, Kai-hui, Markov, Igor L., Bertacco, Valeria

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  • Offers coverage of novel techniques to automate IC debugging, a subject rarely covered in other books
  • Provides comprehensive scope and solutions, from RTL to post-silicon debugging
  • The innovative techniques covered in this book are recent and have been featured by MIT Technology Review, EE Times, SCD Source, IEEE Computer, and other sources
  • First empirical comparison of several methods for spare-cell insertion
  • A variety of examples and figures to illustrate key concepts and algorithms
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About this book

Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.

About the authors

Winner of the EDAA (European Design Automation Association) Outstanding Monograph Award in the Verification section. Co-authors Bertacco and Markov are existing Springer authors

Table of contents (13 chapters)

Table of contents (13 chapters)

Buy this book

eBook 117,69 €
price for Spain (gross)
  • ISBN 978-1-4020-9365-4
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 166,39 €
price for Spain (gross)
  • ISBN 978-1-4020-9364-7
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 145,78 €
price for Spain (gross)
  • ISBN 978-90-481-8112-4
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Functional Design Errors in Digital Circuits
Book Subtitle
Diagnosis Correction and Repair
Authors
Series Title
Lecture Notes in Electrical Engineering
Series Volume
32
Copyright
2009
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media B.V.
eBook ISBN
978-1-4020-9365-4
DOI
10.1007/978-1-4020-9365-4
Hardcover ISBN
978-1-4020-9364-7
Softcover ISBN
978-90-481-8112-4
Series ISSN
1876-1100
Edition Number
1
Number of Pages
XXIV, 200
Topics

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