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Frontiers in Electronic Testing

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Authors: Hamdioui, Said

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About this book

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed.
Features:
-Fault primitive based analysis of memory faults,
-A complete framework of and classification memory faults,
-A systematic way to develop optimal and high quality memory test algorithms,
-A systematic way to develop test patterns for any multi-port SRAM,
-Challenges and trends in embedded memory testing.

Reviews

From the reviews:

"Static random access memories (SRAMs) enjoy a strategic position in the microelectronic industry. … This book concentrates on the study of fault modeling, testing and test strategies for SRAMs. … The book provides a well-written coverage in the area of single-, two- and n-port SRAM testing, fault modeling, and simulation. It is well-organized and very timely. … The book promises to make valuable contribution to the education of graduate students … . I highly recommend this book … ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)


Table of contents (11 chapters)

Table of contents (11 chapters)

Buy this book

eBook 117,69 €
price for Spain (gross)
  • ISBN 978-1-4757-6706-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 155,99 €
price for Spain (gross)
  • ISBN 978-1-4020-7752-4
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 155,99 €
price for Spain (gross)
  • ISBN 978-1-4419-5430-5
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Testing Static Random Access Memories
Book Subtitle
Defects, Fault Models and Test Patterns
Authors
Series Title
Frontiers in Electronic Testing
Series Volume
26
Copyright
2004
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4757-6706-3
DOI
10.1007/978-1-4757-6706-3
Hardcover ISBN
978-1-4020-7752-4
Softcover ISBN
978-1-4419-5430-5
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XX, 221
Topics

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