Frontiers in Electronic Testing

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Editors: Benso, Alfredo, Prinetto, Paolo (Eds.)

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eBook 117,69 €
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  • ISBN 978-0-306-48711-8
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Hardcover 176,79 €
price for Spain (gross)
  • ISBN 978-1-4020-7589-6
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Softcover 145,78 €
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  • ISBN 978-1-4419-5391-9
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
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About this book

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance.

Table of contents (13 chapters)

Table of contents (13 chapters)

Buy this book

eBook 117,69 €
price for Spain (gross)
  • ISBN 978-0-306-48711-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 176,79 €
price for Spain (gross)
  • ISBN 978-1-4020-7589-6
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 145,78 €
price for Spain (gross)
  • ISBN 978-1-4419-5391-9
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
Editors
  • Alfredo Benso
  • Paolo Prinetto
Series Title
Frontiers in Electronic Testing
Series Volume
23
Copyright
2003
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-0-306-48711-8
DOI
10.1007/b105828
Hardcover ISBN
978-1-4020-7589-6
Softcover ISBN
978-1-4419-5391-9
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XIV, 241
Topics