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Frontiers in Electronic Testing

High Performance Memory Testing

Design Principles, Fault Modeling and Self-Test

Authors: Adams, R. Dean

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About this book

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Reviews

From the reviews:

"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)


Table of contents (15 chapters)

Table of contents (15 chapters)

Buy this book

eBook 96,29 €
price for Spain (gross)
  • ISBN 978-0-306-47972-4
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 176,79 €
price for Spain (gross)
  • ISBN 978-1-4020-7255-0
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 124,79 €
price for Spain (gross)
  • ISBN 978-1-4757-8474-9
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
High Performance Memory Testing
Book Subtitle
Design Principles, Fault Modeling and Self-Test
Authors
Series Title
Frontiers in Electronic Testing
Series Volume
22A
Copyright
2003
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-0-306-47972-4
DOI
10.1007/b101876
Hardcover ISBN
978-1-4020-7255-0
Softcover ISBN
978-1-4757-8474-9
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XIV, 250
Topics

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