The Springer International Series in Engineering and Computer Science

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Authors: Pineda de Gyvez, Jose

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About this book

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.

Table of contents (8 chapters)

Table of contents (8 chapters)

Buy this book

eBook 85,59 €
price for Spain (gross)
  • ISBN 978-1-4615-3158-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 124,79 €
price for Spain (gross)
  • ISBN 978-0-7923-9306-1
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 103,99 €
price for Spain (gross)
  • ISBN 978-1-4613-6383-5
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Authors
Series Title
The Springer International Series in Engineering and Computer Science
Series Volume
208
Copyright
1993
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4615-3158-6
DOI
10.1007/978-1-4615-3158-6
Hardcover ISBN
978-0-7923-9306-1
Softcover ISBN
978-1-4613-6383-5
Series ISSN
0893-3405
Edition Number
1
Number of Pages
XXIV, 167
Number of Illustrations
48 b/w illustrations
Topics