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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Authors: Echlin, Patrick

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  • Identifies problems that all specimens present in examining their structure and analysis in the SEM
  • Describes a series of protocols to ensure that a specimen is properly prepared once the particular problems are identified
  • Guides the reader through a general approach to the problem before a particular procedure is applied to the requirements of a given sample
  • Designed both as an introduction for the novice and as a guide for the practicing scanning microscopist
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eBook 89,24 €
price for Spain (gross)
  • ISBN 978-0-387-85731-2
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 109,19 €
price for Spain (gross)
  • ISBN 978-0-387-85730-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 109,19 €
price for Spain (gross)
  • ISBN 978-1-4419-4674-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
About this book

This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzers. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al., it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument. Photomicrographs of each specimen complement the many sample preparation "recipes." Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This practical Handbook is an essential reference for anyone who uses these instruments. It assumes only an elementary knowledge of preparation techniques but also serves as an authoritative guide for more experienced microscopists.

About the authors

Patrick Echlin was a lecturer in the Department of Plant Sciences and Director of the Multi-Imaging Centre, School of Biological Science, University of Cambridge until he retired in 1999. He has taught for more than thirty years at the Lehigh University Microscopy School and is the author and co-auther of eight books on scanning electron microscopy and x-ray microanalysis. He is an Honorary Fellow of the Royal Microscopical Society and received the Distinguished Scientist Award in Biological Sciences from the Microscope Society of America in 2001.

Reviews

This handbook should find its way to the reference bookshelf of all imaging laboratories. It should also become required reading for anyone being trained for SEM work, or anyone who might need to have their samples examined by using such techniques. In that way, it will be less likely that deficient results will be published and that the full potential of the SEM be realized. -- Iolo ap Gwynn, Microscopy and Microanalysis (2010)

Table of contents (13 chapters)

Table of contents (13 chapters)

Buy this book

eBook 89,24 €
price for Spain (gross)
  • ISBN 978-0-387-85731-2
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 109,19 €
price for Spain (gross)
  • ISBN 978-0-387-85730-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 109,19 €
price for Spain (gross)
  • ISBN 978-1-4419-4674-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Authors
Copyright
2009
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-0-387-85731-2
DOI
10.1007/978-0-387-85731-2
Hardcover ISBN
978-0-387-85730-5
Softcover ISBN
978-1-4419-4674-4
Edition Number
1
Number of Pages
XII, 332
Number of Illustrations
159 illustrations in colour
Topics