Scanning Microscopy for Nanotechnology
Techniques and Applications
Editors: Zhou, Weilie, Wang, Zhong Lin (Eds.)
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- About this book
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Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
- Table of contents (15 chapters)
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Fundamentals of Scanning Electron Microscopy (SEM)
Pages 1-40
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Backscattering Detector and EBSD in Nanomaterials Characterization
Pages 41-75
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X-ray Microanalysis in Nanomaterials
Pages 76-100
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Low kV Scanning Electron Microscopy
Pages 101-119
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E-beam Nanolithography Integrated with Scanning Electron Microscope
Pages 120-151
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Table of contents (15 chapters)
- Download Preface 1 PDF (59.8 KB)
- Download Sample pages 2 PDF (1.7 MB)
- Download Table of contents PDF (69.9 KB)
Bibliographic Information
- Bibliographic Information
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- Book Title
- Scanning Microscopy for Nanotechnology
- Book Subtitle
- Techniques and Applications
- Editors
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- Weilie Zhou
- Zhong Lin Wang
- Copyright
- 2007
- Publisher
- Springer-Verlag New York
- Copyright Holder
- Springer-Verlag New York
- eBook ISBN
- 978-0-387-39620-0
- DOI
- 10.1007/978-0-387-39620-0
- Hardcover ISBN
- 978-0-387-33325-0
- Softcover ISBN
- 978-1-4419-2209-0
- Edition Number
- 1
- Number of Pages
- XIV, 522
- Number of Illustrations
- 399 b/w illustrations
- Topics
