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Scanning Microscopy for Nanotechnology

Techniques and Applications

Editors: Zhou, Weilie, Wang, Zhong Lin (Eds.)

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eBook 118,99 €
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  • ISBN 978-0-387-39620-0
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Hardcover 187,19 €
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  • ISBN 978-0-387-33325-0
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Softcover 155,50 €
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  • ISBN 978-1-4419-2209-0
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About this book

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.

Table of contents (15 chapters)

Table of contents (15 chapters)

Buy this book

eBook 118,99 €
price for Spain (gross)
  • ISBN 978-0-387-39620-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 187,19 €
price for Spain (gross)
  • ISBN 978-0-387-33325-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 155,50 €
price for Spain (gross)
  • ISBN 978-1-4419-2209-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Scanning Microscopy for Nanotechnology
Book Subtitle
Techniques and Applications
Editors
  • Weilie Zhou
  • Zhong Lin Wang
Copyright
2007
Publisher
Springer-Verlag New York
Copyright Holder
Springer-Verlag New York
eBook ISBN
978-0-387-39620-0
DOI
10.1007/978-0-387-39620-0
Hardcover ISBN
978-0-387-33325-0
Softcover ISBN
978-1-4419-2209-0
Edition Number
1
Number of Pages
XIV, 522
Number of Illustrations
399 b/w illustrations
Topics