Frontiers in Electronic Testing

Advances in Electronic Testing

Challenges and Methodologies

Editors: Gizopoulos, Dimitris (Ed.)

Free Preview

Buy this book

eBook 154,69 €
price for Spain (gross)
  • ISBN 978-0-387-29409-4
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 207,99 €
price for Spain (gross)
  • ISBN 978-0-387-29408-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 194,38 €
price for Spain (gross)
  • ISBN 978-1-4899-8773-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
About this book

Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.

The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.

Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.

"There is a definite need for documenting the advances in testing … I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. […] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. […] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.

Reviews

"There is a definite need for documenting the advances in testing … I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. […] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. […] This latest addition to the Frontiers Series is destined to serve an important role."

From the Foreword by Vishwani D. Agrawal, Consulting Editor
Frontiers in Electronic Testing Book Series


Table of contents (11 chapters)

Table of contents (11 chapters)
  • Defect-Orinted Testing

    Aitken, Robert C

    Pages 1-42

  • Failure Mechanisms and Testing in Nanometer Technologies

    Segura, Jaume (et al.)

    Pages 43-75

  • Silicon Debug

    Josephson, Doug (et al.)

    Pages 77-108

  • Delay Testing

    Cron, Adam

    Pages 109-139

  • High-Speed Digital Test Interfaces

    Maichen, Wolfgang

    Pages 141-178

Buy this book

eBook 154,69 €
price for Spain (gross)
  • ISBN 978-0-387-29409-4
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 207,99 €
price for Spain (gross)
  • ISBN 978-0-387-29408-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 194,38 €
price for Spain (gross)
  • ISBN 978-1-4899-8773-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Advances in Electronic Testing
Book Subtitle
Challenges and Methodologies
Editors
  • Dimitris Gizopoulos
Series Title
Frontiers in Electronic Testing
Series Volume
27
Copyright
2006
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-0-387-29409-4
DOI
10.1007/0-387-29409-0
Hardcover ISBN
978-0-387-29408-7
Softcover ISBN
978-1-4899-8773-0
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XXV, 412
Topics