Overview
- The first textbook for graduate students to explain the imaging mechanism of STEM in detail as well as TEM
- Straightforward description focusing on imaging of TEM and STEM, by relegating supporting knowledge to the appendices
- Contains a consistent description of TEM and STEM imaging on the basis of Fourier transform theory
- Includes appendices and exercises useful for graduate students
- Includes supplementary material: sn.pub/extras
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Table of contents (31 chapters)
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Nano-imaging by Transmission Electron Microscopy
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Nano-imaging by Scanning Transmission Electron Microscopy
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Appendix: Basics for Understanding TEM and STEM Imaging
Keywords
About this book
In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide fortoday’s graduate students and professionals just starting their careers.
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Bibliographic Information
Book Title: Electron Nano-Imaging
Book Subtitle: Basics of Imaging and Diffraction for TEM and STEM
Authors: Nobuo Tanaka
DOI: https://doi.org/10.1007/978-4-431-56502-4
Publisher: Springer Tokyo
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Japan KK 2017
Hardcover ISBN: 978-4-431-56500-0Published: 10 April 2017
Softcover ISBN: 978-4-431-56804-9Published: 25 July 2018
eBook ISBN: 978-4-431-56502-4Published: 04 April 2017
Edition Number: 1
Number of Pages: XXVIII, 333
Number of Illustrations: 107 b/w illustrations, 22 illustrations in colour
Topics: Characterization and Evaluation of Materials, Spectroscopy and Microscopy, Spectroscopy/Spectrometry, Nanoscale Science and Technology