Authors:
- Up-to-date review of the state of the art
- Important methods for surface and semiconductor physics
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Tracts in Modern Physics (STMP, volume 154)
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Table of contents (11 chapters)
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Front Matter
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Back Matter
About this book
Reviews
Ultramicroscopy, 2001/87
Bibliographic Information
Book Title: Applied RHEED
Book Subtitle: Reflection High-Energy Electron Diffraction During Crystal Growth
Authors: Wolfgang Braun
Series Title: Springer Tracts in Modern Physics
DOI: https://doi.org/10.1007/BFb0109548
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1999
Softcover ISBN: 978-3-662-15614-8Published: 20 November 2013
eBook ISBN: 978-3-540-49485-0Published: 28 September 2007
Series ISSN: 0081-3869
Series E-ISSN: 1615-0430
Edition Number: 1
Number of Pages: IX, 220
Number of Illustrations: 169 b/w illustrations, 11 illustrations in colour
Topics: Condensed Matter Physics, Measurement Science and Instrumentation