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A Beginners' Guide to Scanning Electron Microscopy

  • Book
  • © 2018

Overview

Authors:
  1. Anwar Ul-Hamid

    1. Center for Engineering Research, King Fahd University of Petroleum & Minerals, Dhahran, Saudi Arabia

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  • Provides a concise and accessible introduction to the essentials of SEM
  • Includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts
  • Highlights recent advances in instrumentation, imaging and sample preparation techniques
  • Offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds

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Table of contents (9 chapters)

  1. Front Matter

    Pages i-xxii
    Download chapter PDF

  2. Introduction

    • Anwar Ul-Hamid
    Pages 1-14

  3. Components of the SEM

    • Anwar Ul-Hamid
    Pages 15-76

  4. Contrast Formation in the SEM

    • Anwar Ul-Hamid
    Pages 77-128

  5. Imaging with the SEM

    • Anwar Ul-Hamid
    Pages 129-180

  6. Specialized SEM Techniques

    • Anwar Ul-Hamid
    Pages 181-232

  7. Characteristics of X-Rays

    • Anwar Ul-Hamid
    Pages 233-264

  8. Microchemical Analysis in the SEM

    • Anwar Ul-Hamid
    Pages 265-307

  9. Sample Preparation

    • Anwar Ul-Hamid
    Pages 309-359

  10. Correction to: A Beginners’ Guide to Scanning Electron Microscopy

    • Anwar Ul-Hamid
    Pages C1-C1

  11. Back Matter

    Pages 361-402
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Keywords

About this book

This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.
A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book 
  • provides a concise and accessible introduction to the essentials of SEM
  • includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts
  • highlights recent advances in instrumentation, imaging and sample preparation techniques
  • offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.



Authors and Affiliations

  • Center for Engineering Research, King Fahd University of Petroleum & Minerals, Dhahran, Saudi Arabia

    Anwar Ul-Hamid

About the author

Anwar Ul-Hamid received his B.Sc. in Metallurgical Engineering and Materials Science at the University of Engineering & Technology in Lahore, Pakistan in 1991. He received his Ph.D,. for Oxidation of High Temperature alloys/Analytical Electron Microscopy at the Department of Materials Science & Metallurgy at the University of Cambridge in 1996.

He has published over 70 peer-reviewed papers in journals and proceedings, and is currently Coordinator of the Materials Characterization Laboratory (MCL)/Research Institute at King Fahd University of Petroleum & Minerals, in Dhahran, Saudi Arabia.

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