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Applied RHEED

Reflection High-Energy Electron Diffraction During Crystal Growth

  • Book
  • © 1999

Overview

  • Up-to-date review of the state of the art
  • Important methods for surface and semiconductor physics
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Tracts in Modern Physics (STMP, volume 154)

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Table of contents (11 chapters)

Keywords

About this book

The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.

Reviews

Anyone interested in L.-M. Peng's chapter on RHEED will want to know that an entire volume on the subject has been written by W. Braun (9). This is a substantial work, full of practical detail...
Ultramicroscopy, 2001/87

Bibliographic Information

  • Book Title: Applied RHEED

  • Book Subtitle: Reflection High-Energy Electron Diffraction During Crystal Growth

  • Authors: Wolfgang Braun

  • Series Title: Springer Tracts in Modern Physics

  • DOI: https://doi.org/10.1007/BFb0109548

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1999

  • Softcover ISBN: 978-3-662-15614-8Published: 20 November 2013

  • eBook ISBN: 978-3-540-49485-0Published: 28 September 2007

  • Series ISSN: 0081-3869

  • Series E-ISSN: 1615-0430

  • Edition Number: 1

  • Number of Pages: IX, 220

  • Number of Illustrations: 169 b/w illustrations, 11 illustrations in colour

  • Topics: Condensed Matter Physics, Measurement Science and Instrumentation

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