Overview
- Describes the state-of-the-art, regarding noise in nanometer semiconductor devices
- Enables readers to design more reliable semiconductor devices
- Offers the most up-to-date information on point defects, based on physical microscopic models
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Table of contents (20 chapters)
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Front Matter
Keywords
About this book
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects.
- Describes the state-of-the-art, regarding noise in nanometer semiconductor devices;
- Enables readers to design more reliable semiconductor devices;
- Offers the most up-to-date information on point defects, based on physical microscopic models.
Editors and Affiliations
About the editor
Bibliographic Information
Book Title: Noise in Nanoscale Semiconductor Devices
Editors: Tibor Grasser
DOI: https://doi.org/10.1007/978-3-030-37500-3
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Nature Switzerland AG 2020
Hardcover ISBN: 978-3-030-37499-0Published: 27 April 2020
Softcover ISBN: 978-3-030-37502-7Published: 27 April 2021
eBook ISBN: 978-3-030-37500-3Published: 26 April 2020
Edition Number: 1
Number of Pages: VI, 729
Number of Illustrations: 107 b/w illustrations, 443 illustrations in colour
Topics: Circuits and Systems, Electronic Circuits and Devices, Electronics and Microelectronics, Instrumentation