Overview
- Exposes the effect of surface topography on fretting
- Comprehensive text on dry gross fretting
- Lists the parameters that influence dry gross fretting of rough surfaces
Part of the book series: SpringerBriefs in Applied Sciences and Technology (BRIEFSAPPLSCIENCES)
Part of the book sub series: Manufacturing and Surface Engineering (BRIEFSMANUFACT)
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Table of contents (3 chapters)
Keywords
About this book
In this book, the authors present a comprehensive study of the effects of operating parameters (load, amplitude, frequency) on dry gross fretting of rough surfaces. It helps the reader to efficient surface preparations in order to monitor and reduce damage caused by fretting. It exposes the effect of surface topography on fretting, which is often neglected.
Authors and Affiliations
About the authors
Andrzej Dzierwa has a PhD in Technical Sciences and is a researcher at Rzeszow University of Technology, Department of Manufacturing Processes and Production Engineering, Poland. His research interests include tribology and technical metrology. He is a member of Polish Tribological Society; The Society of Tribologists and Lubrication Engineers (STLE) and Hong Kong Society of Mechanical Engineering (HKSME).
Bibliographic Information
Book Title: Dry Gross Fretting of Rough Surfaces
Book Subtitle: Influential Parameters
Authors: Pawel Pawlus, Andrzej Dzierwa, Agnieszka Lenart
Series Title: SpringerBriefs in Applied Sciences and Technology
DOI: https://doi.org/10.1007/978-3-030-31563-4
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Author(s), under exclusive license to Springer Nature Switzerland AG 2020
Softcover ISBN: 978-3-030-31562-7Published: 24 October 2019
eBook ISBN: 978-3-030-31563-4Published: 11 October 2019
Series ISSN: 2191-530X
Series E-ISSN: 2191-5318
Edition Number: 1
Number of Pages: VII, 57
Number of Illustrations: 2 b/w illustrations, 36 illustrations in colour
Topics: Surfaces and Interfaces, Thin Films, Tribology, Corrosion and Coatings, Surface and Interface Science, Thin Films