Probing Crystal Plasticity at the Nanoscales

1. Front Matter

   Pages i-ix

   PDF

2. Introduction

   • Arief Suriadi Budiman

   Pages 1-13

3. Synchrotron White-Beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab

   • Arief Suriadi Budiman

   Pages 15-35

4. Electromigration-Induced Plasticity in Cu Interconnects: The Length Scale Dependence

   • Arief Suriadi Budiman

   Pages 37-52

5. Electromigration-Induced Plasticity in Cu Interconnects: The Texture Dependence

   • Arief Suriadi Budiman

   Pages 53-67

6. Industrial Implications of Electromigration-Induced Plasticity in Cu Interconnects: Plasticity-Amplified Diffusivity

   • Arief Suriadi Budiman

   Pages 69-86

7. Indentation Size Effects in Single Crystal Cu as Revealed by Synchrotron X-ray Microdiffraction

   • Arief Suriadi Budiman

   Pages 87-101

8. Smaller is Stronger: Size Effects in Uniaxially Compressed Au Submicron Single Crystal Pillars

   • Arief Suriadi Budiman

   Pages 103-115

9. Conclusions

   • Arief Suriadi Budiman

   Pages 117-118

This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single crystal submicron gold pillars.

When crystalline materials are mechanically deformed in small volumes, higher stresses are needed for plastic flow. This has been called the "Smaller is Stronger" phenomenon and has been widely observed. studies suggest that plasticity in one case is indeed controlled by the GNDs (strain gradient hardening), whereas in the other, plasticity is not controlled by strain gradients or sub-structure hardening, but rather by dislocation source starvation, wherein smaller volumes are stronger because fewer sources of dislocations are available (dislocation starvation hardening).

• Crystal Plasticity
• Electromigration
• Induced Plasticity
• Plasticity-amplified Diffusivity
• Single Crystal Pillars
• Smaller is Stronger
• Synchrotron White-beam
• X-ray Microdiffraction

• Singapore University of Technology and Design, Singapore, Singapore

  Arief Suriadi Budiman

Dr. Arief Suriadi Budiman received his Ph.D. in Materials Science and Engineering from Stanford University, CA. Before deciding to pursue his doctoral career, he first embarked on his technical career with Hewlett-Packard, Co in Singapore researching and developing microfabrication processes for HP’s latest generation of inkjet print head MEMS chip. During his doctoral candidacy at Stanford’s Department of Materials Science & Engineering under the supervision of Professor William D. Nix (MRS Von Hippel Award 2007), Dr. Budiman received several research awards (MRS Graduate Silver Award 2006, MRS Best Paper 2006) and contributed to several journal publications. Most recently Dr. Budiman has been awarded the prestigious Los Alamos National Laboratory (LANL) Director's Research Fellowship to conduct top strategic research for the energy and national security missions of the Los Alamos National Laboratory's. At the Center for Integrated Nanotechnologies (CINT) at Los Alamos, Dr. Budiman’s research program involves nanoscale multilayered composite materials for extreme environments with potential applications in advanced energy systems including for next generation nuclear power reactors.

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