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Ultimate Limits of Fabrication and Measurement

  • Book
  • © 1995

Overview

Editors:
  1. M. E. Welland

    1. Department of Engineering, The University of Cambridge, Cambridge, UK

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  2. J. K. Gimzewski

    1. IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: NATO Science Series E: (NSSE, volume 292)

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Table of contents (35 chapters)

  1. Front Matter

    Pages i-x
    Download chapter PDF

  2. Towards Molecular and Supramolecular Devices

    1. Towards Molecular and Supramolecular Devices

      • Jon A. Preece, J. Fraser Stoddart
      Pages 1-8

  3. Nanoscale Fabrication

    1. Nanoscale Fabrication

      • W. M. Tolles
      Pages 9-16

  4. Microminiaturization in Laser Surgery and in vivo Intradiscal Pressure Measurement in Intervertebral Discs

    1. Microminiaturization in Laser Surgery and in vivo Intradiscal Pressure Measurement in Intervertebral Discs

      • Harcharan Singh Ranu
      Pages 17-24

  5. Self Replicating Systems and Low Cost Manufacturing

    1. Self Replicating Systems and Low Cost Manufacturing

      • Ralph C. Merkle
      Pages 25-32

  6. The Use of Actuation Principles for Micro Robots

    1. The Use of Actuation Principles for Micro Robots

      • U. Rembold, S. Fatikow, TH. Dörsam, B. Magnussen
      Pages 33-40

  7. Biophysical Approach to Nano-Mental Engineering’s Limits

    1. Biophysical Approach to Nano-Mental Engineering’s Limits

      • Eric Wallich
      Pages 41-48

  8. IDEAS -Intelligent Design Environment for Algorithms and Systems

    1. IDEAS -Intelligent Design Environment for Algorithms and Systems

      • Thomas Beth, Jörn Müller-Quade, Armin Nückel
      Pages 49-57

  9. Electron-Nucleus Interaction in a Finite Atomic Line Modulated by a Focussed Electric Field

    1. Electron-Nucleus Interaction in a Finite Atomic Line Modulated by a Focussed Electric Field

      • C. Joachim, J. L. Heully, M. Devel, C. Girard
      Pages 59-66

  10. Electromagnetic Radiation in Nanostructures

    1. Electromagnetic Radiation in Nanostructures

      • J. B. Pendry
      Pages 67-74

  11. Using Atom Optics to Fabricate Nanostructures

    1. Using Atom Optics to Fabricate Nanostructures

      • R. J. Celotta, J. J. McClelland, R. E. Scholten, R. Gupta
      Pages 75-78

  12. Limits to Squeezing of Quantum Fluctuations

    1. Limits to Squeezing of Quantum Fluctuations

      • Arkadiusz OrÅ‚owski
      Pages 79-87

  13. Micromechanical Calorimeter with Picojoule-Sensitivity

    1. Micromechanical Calorimeter with Picojoule-Sensitivity

      • E. Meyer, J. K. Gimzewski, CH. Gerber, R. R. Schlittler
      Pages 89-95

  14. The Point-Contact Thermometer and Its Application in the Study of Hydrodynamic Electron Flow

    1. The Point-Contact Thermometer and Its Application in the Study of Hydrodynamic Electron Flow

      • L. W. Molenkamp, M. J. M. De Jong
      Pages 97-104

  15. Noise in Scanning Tunneling Microscopy

    1. Noise in Scanning Tunneling Microscopy

      • B. Koslowski, C. Baur, K. Dransfeld
      Pages 105-113

  16. A Nanosensor for Admittance Spectroscopy

    1. A Nanosensor for Admittance Spectroscopy

      • Lars Montelius, Jonas O. Tegenfeldt, Torbjörn G. I. Ling
      Pages 115-122

  17. Nanodeformation -Solid or Liquid?

    1. Nanodeformation - Solid or Liquid?

      • J. B. Pethica
      Pages 123-127

  18. Theory of Conduction through Quantum Necks

    1. Theory of Conduction through Quantum Necks

      • J. A. Torres, J. J. Sáenz
      Pages 129-137

  19. A Scanning Force and Friction Microscope

    1. A Scanning Force and Friction Microscope

      • PH. Niedermann, J. Burger, M. Binggeli, R. Christoph, H. E. Hintermann, O. Marti
      Pages 139-145

  20. Electrical Properties of Nanometer-Size Metal-Semiconductor Point Contacts

    1. Electrical Properties of Nanometer-Size Metal-Semiconductor Point Contacts

      • Y. Hasegawa, I.-W. Lyo, PH. Avouris
      Pages 147-154
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Keywords

About this book

An extensive body of research is involved in pushing miniaturisation to its physical limit, encompassing the miniaturisation of electronic devices, the manipulation of single atoms by scanning tunnelling microscopy, bio-engineering, the chemical synthesis of complex molecules, microsensor technology, and information storage and retrieval. In parallel to these practical aspects of miniaturisation there is also the necessity to understand the physics of small structures.
Ultimate Limits of Fabrication and Measurement brings together a number of leading articles from a variety of fields with the common aim of ultimate miniaturisation and measurement.

Editors and Affiliations

  • Department of Engineering, The University of Cambridge, Cambridge, UK

    M. E. Welland

  • IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland

    J. K. Gimzewski

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