Overview
- Unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring (probably only on the market)
- Numerous examples and easy to follow procedure for modeling, analysis and estimation of process variation, noise and temperature for both analog/mixed-signal and digital circuits
- Both state-of-the art software and hardware implementations and their chip realizations are given
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Advanced Microelectronics (MICROELECTR., volume 48)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (6 chapters)
Keywords
- Deep-submicron CMOS
- Dynamic Thermal Methodology
- Electrothermal Couplings
- High Performance MPSoC
- Low Voltage Die-Level Process Variation
- Modified Runge-Kutta Solver
- Power Management
- Process Variability Analysis
- Reliable Mixed-Signal Circuit Design
- Statistical Transistor Model
- electrical noise
- process variation
- stochastic analysis
About this book
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.
In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.
Â
Authors and Affiliations
About the author
Amir Zjajo received the M.Sc. and DIC degrees from the Imperial College London, London, U.K., in 2000 and the Ph.D. degree from Eindhoven University of Technology, Eindhoven, The Netherlands in 2010, all in electrical engineering. In 2000, he joined Philips Research Laboratories as a member of the research staff in the Mixed-Signal Circuits and Systems Group. From 2006 until 2009, he was with Corporate Research of NXP Semiconductors as a senior research scientist. In 2009, he joined Delft University of Technology as a Faculty member in the Circuit and Systems Group.
Dr. Zjajo has published more than 70 papers in referenced journals and conference proceedings, and holds more than 10 US patents or patents pending. He is the author of the book Low-Voltage High-Resolution A/D Converters: Design, Test and Calibration (Springer, 2011, Chinese translation, 2012). He serves as a member of Technical Program Committee of IEEE Design, Automation and Test in Europe Conference, IEEE International Symposium on Circuits and Systems and IEEE International Mixed-Signal Circuits, Sensors and Systems Workshop. His research interests include mixed-signal circuit design, signal integrity and timing and yield optimization.Bibliographic Information
Book Title: Stochastic Process Variation in Deep-Submicron CMOS
Book Subtitle: Circuits and Algorithms
Authors: Amir Zjajo
Series Title: Springer Series in Advanced Microelectronics
DOI: https://doi.org/10.1007/978-94-007-7781-1
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media Dordrecht 2014
Hardcover ISBN: 978-94-007-7780-4Published: 28 November 2013
Softcover ISBN: 978-94-024-0285-8Published: 23 August 2016
eBook ISBN: 978-94-007-7781-1Published: 19 November 2013
Series ISSN: 1437-0387
Series E-ISSN: 2197-6643
Edition Number: 1
Number of Pages: XIX, 192
Number of Illustrations: 46 b/w illustrations
Topics: Electronic Circuits and Devices, Circuits and Systems, Complex Systems, Mathematical and Computational Engineering, Physiological, Cellular and Medical Topics, Statistical Physics and Dynamical Systems