Overview
- Provides an extensive overview of radiation effects on integrated circuits
- Coverage of space radiation effects
- Design hardening methodologies
- Simulation techniques of the transient effects of radiation on integrated circuits
- Methodology and tools for radiation ground testing on circuits and systems
- Qualification of circuits and systems for space applications
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Table of contents (12 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.
This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.
Editors and Affiliations
Bibliographic Information
Book Title: Radiation Effects on Embedded Systems
Editors: RAOUL VELAZCO, PASCAL FOUILLAT, RICARDO REIS
DOI: https://doi.org/10.1007/978-1-4020-5646-8
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media B.V. 2007
Hardcover ISBN: 978-1-4020-5645-1Published: 04 June 2007
Softcover ISBN: 978-90-481-7417-1Published: 19 October 2010
eBook ISBN: 978-1-4020-5646-8Published: 19 June 2007
Edition Number: 1
Number of Pages: VIII, 269
Topics: Circuits and Systems, Effects of Radiation/Radiation Protection, Electrical Engineering, Electronics and Microelectronics, Instrumentation, Nuclear Energy, Nuclear Energy