Editors:
- Gives a complete survey of the current state of the art of X-ray absorption spectroscopy of semiconductors
- Provides an overview of a wide range of semiconductor materials
- Displays comprehensive summaries to allow the reader to access the growing research activities
- Familiarizes the reader with numerous examples of XAS applications
- Introduces newcomers to the XAS technique
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Optical Sciences (SSOS, volume 190)
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Table of contents (16 chapters)
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Front Matter
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Crystalline Semiconductors
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Front Matter
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Disordered Semiconductors
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Front Matter
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Semiconductor Nanostructures
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Front Matter
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Magnetic Semiconductors
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Front Matter
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About this book
Keywords
Editors and Affiliations
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Friedrich-Schiller-University Jena Institute of Solid State Physics, Jena, Germany
Claudia S. Schnohr
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Department of Electronic Materials Engineering, The Australian National University, Canberra, Australia
Mark C. Ridgway
Bibliographic Information
Book Title: X-Ray Absorption Spectroscopy of Semiconductors
Editors: Claudia S. Schnohr, Mark C. Ridgway
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-3-662-44362-0
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2015
Hardcover ISBN: 978-3-662-44361-3Published: 17 November 2014
Softcover ISBN: 978-3-662-52212-7Published: 23 August 2016
eBook ISBN: 978-3-662-44362-0Published: 05 November 2014
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 1
Number of Pages: XVI, 361
Number of Illustrations: 99 b/w illustrations, 86 illustrations in colour
Topics: Semiconductors, Optical and Electronic Materials, Spectroscopy and Microscopy, Characterization and Evaluation of Materials, Applied and Technical Physics, Classical Electrodynamics