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  • © 2002

Anomalous X-Ray Scattering for Materials Characterization

Atomic-Scale Structure Determination

Authors:

  • This book is the first one on anomalous X-ray scattering
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Tracts in Modern Physics (STMP, volume 179)

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About this book

The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.

Authors and Affiliations

  • Institute for Advanced Materials Processing, Tohoku University, Sendai, Japan

    Yoshio Waseda

Bibliographic Information

  • Book Title: Anomalous X-Ray Scattering for Materials Characterization

  • Book Subtitle: Atomic-Scale Structure Determination

  • Authors: Yoshio Waseda

  • Series Title: Springer Tracts in Modern Physics

  • DOI: https://doi.org/10.1007/3-540-46008-X

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 2002

  • Hardcover ISBN: 978-3-540-43443-6Published: 11 September 2002

  • Softcover ISBN: 978-3-662-14637-8Published: 03 October 2013

  • eBook ISBN: 978-3-540-46008-4Published: 01 July 2003

  • Series ISSN: 0081-3869

  • Series E-ISSN: 1615-0430

  • Edition Number: 1

  • Number of Pages: XIV, 214

  • Topics: Surfaces and Interfaces, Thin Films, Characterization and Evaluation of Materials

Buy it now

Buying options

eBook USD 169.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access