Editors:
- Includes supplementary material: sn.pub/extras
Part of the book series: Lecture Notes in Physics (LNP, volume 588)
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Table of contents (27 papers)
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Front Matter
About this book
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.
Reviews
"This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it." (Ultramicroscopy, 99, 2004)
Editors and Affiliations
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NTT Basic Research Laboratories, Atsugi-shi Kanagawa, Japan
Yoshio Watanabe
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Istituto MASPEC, Parma, Italy
Giancarlo Salviati
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Sincrotrone Trieste, Trieste, Italy
Stefan Heun
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Tokyo Institute of Technology, Tokyo, Japan
Naoki Yamamoto
Bibliographic Information
Book Title: Nanoscale Spectroscopy and Its Applications to Semiconductor Research
Editors: Yoshio Watanabe, Giancarlo Salviati, Stefan Heun, Naoki Yamamoto
Series Title: Lecture Notes in Physics
DOI: https://doi.org/10.1007/3-540-45850-6
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2002
Hardcover ISBN: 978-3-540-43312-5Published: 19 July 2002
Softcover ISBN: 978-3-662-14372-8Published: 03 October 2013
eBook ISBN: 978-3-540-45850-0Published: 11 January 2008
Series ISSN: 0075-8450
Series E-ISSN: 1616-6361
Edition Number: 1
Number of Pages: XV, 308
Topics: Nanotechnology, Optical and Electronic Materials, Solid State Physics, Spectroscopy and Microscopy, Measurement Science and Instrumentation