Overview
- Authors:
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Jean Daillant
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Service de Physique de I’Etat Condensé, CEA Saclay, Gif-sur-Yvette Cedex, France
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Alain Gibaud
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Laboratoire de Physique de l’Etat Condensé, UPRES A 6087, Université du Maine, Faculté des sciences, Le Mans Cedex 9, France
- This is the first comprehensive introduction to x-ray and neutron reflectivity.
- Includes supplementary material: sn.pub/extras
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Table of contents (10 chapters)
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Front Matter
Pages I-XXIII
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Principles
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- Anne Sentenac, Jean Daillant
Pages 60-86
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- Jean Daillant, Anne Sentenac
Pages 121-162
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- Claude Fermon, Frédéric Ott, Alain Menelle
Pages 163-195
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Applications
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- Jean-Marc Gay, Laurent Lapena
Pages 217-231
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- Tilo Baumbach, Petr Mikulik
Pages 232-280
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Back Matter
Pages 325-331
About this book
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Authors and Affiliations
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Service de Physique de I’Etat Condensé, CEA Saclay, Gif-sur-Yvette Cedex, France
Jean Daillant
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Laboratoire de Physique de l’Etat Condensé, UPRES A 6087, Université du Maine, Faculté des sciences, Le Mans Cedex 9, France
Alain Gibaud
