Authors:
- Main benefit is information about the physics of image formation and microanalysis in scanning electron microscopy
- 2nd, completely revised and updated edition
Part of the book series: Springer Series in Optical Sciences (SSOS, volume 45)
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Table of contents (10 chapters)
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Front Matter
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Back Matter
About this book
Reviews
"...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM."
T Mulvey, Measurement Science and Technology. 11, No12, December 2000
Authors and Affiliations
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Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Münster, Germany
Ludwig Reimer
Bibliographic Information
Book Title: Scanning Electron Microscopy
Book Subtitle: Physics of Image Formation and Microanalysis
Authors: Ludwig Reimer
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-3-540-38967-5
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1998
Hardcover ISBN: 978-3-540-63976-3Published: 17 September 1998
Softcover ISBN: 978-3-642-08372-3Published: 01 December 2010
eBook ISBN: 978-3-540-38967-5Published: 11 November 2013
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 2
Number of Pages: XIV, 529
Topics: Spectroscopy and Microscopy, Solid State Physics, Surface and Interface Science, Thin Films, Physics, general