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High-Resolution Imaging and Spectrometry of Materials

  • Book
  • © 2003

Overview

Editors:
  1. Frank Ernst

    1. Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, USA

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    You can also search for this editor in PubMed   Google Scholar

  2. Manfred Rühle

    1. MPI für Materialforschung, Stuttgart, Germany

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    You can also search for this editor in PubMed   Google Scholar

  • In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applications
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 50)

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Table of contents (10 chapters)

  1. Front Matter

    Pages I-XIV
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  2. Microcharacterisation of Materials

    • F. Ernst, W. Sigle
    Pages 1-8

  3. Electron Scattering

    • H. Müller, H. Rose
    Pages 9-68

  4. Structure Determination by Quantitative High-Resolution Transmission Electron Microscopy

    • G. Möbus
    Pages 69-118

  5. Quantitative Analytical Transmission Electron Microscopy

    • P. Kohler-Redlich, J. Mayer
    Pages 119-187

  6. Advances in Electron Optics

    • H. Rose
    Pages 189-270

  7. Tomography by Atom Probe Field Ion Microscopy

    • T. Al-Kassab, H. Wollenberger, G. Schmitz, R. Kirchheim
    Pages 271-320

  8. Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM)

    • H. Neddermeyer, M. Hanbücken
    Pages 321-362

  9. Multi-Method High-Resolution Surface Analysis with Slow Electrons

    • E. Bauer, T. Schmidt
    Pages 363-390

  10. From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites

    • J. Rödel
    Pages 391-418

  11. Microstructural Characterization of Materials: An Assessment

    • R. W. Cahn, G. Ertl, J. Heydenreich
    Pages 419-433

  12. Back Matter

    Pages 435-442
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Keywords

About this book

The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma­ terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.

Editors and Affiliations

  • Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, USA

    Frank Ernst

  • MPI für Materialforschung, Stuttgart, Germany

    Manfred Rühle

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