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Applied Scanning Probe Methods IV

Industrial Applications

  • Book
  • © 2006

Overview

  • First book summarizing the state of the art of this technique
  • Real industrial applications included
  • Includes supplementary material: sn.pub/extras

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (8 chapters)

Keywords

Reviews

From the reviews:

"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)

Editors and Affiliations

  • Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA

    Bharat Bhushan

  • Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Münster, Germany

    Harald Fuchs

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