Advances in Scanning Probe Microscopy

1. Front Matter

   Pages I-XIV

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2. Theory of Scanning Probe Microscopy

   • Naruo Sasaki, Masaru Tsukada

   Pages 1-41

3. The Theoretical Basis of Scanning Tunneling Microscopy for Semiconductors — First-Principles Electronic Structure Theory for Semiconductor Surfaces

   • Takahisa Ohno

   Pages 43-64

4. Atomic Structure of 6H-SiC (0001) and (000\(\bar{1}\))

   • L. Li, T. Sakurai

   Pages 65-90

5. Application of Atom Manipulation for Fabricating Nanoscale and Atomic-Scale Structures on Si Surfaces

   • T. Hashizume, S. Heike, T. Hitosugi, K. Kitazawa

   Pages 91-112

6. Theoretical Insights into Fullerenes Adsorbed on Surfaces: Comparison with STM Studies

   • Kaoru Ohno, Yoshiyuki Kawazoe

   Pages 113-142

7. Apparent Barrier Height and Barrier-Height Imaging of Surfaces

   • Akira Sakai

   Pages 143-165

8. Mesoscopic Work Function Measurement by Scanning Tunneling Microscopy

   • Y. Hasegawa, J. F. Jia, T. Sakurai, Z. Q. Li, K. Ohno, Y. Kawazoe

   Pages 167-191

9. Scanning Tunneling Microscopy of III–V Compound Semiconductor (001) Surfaces

   • Qi-Kun Xue, T. Hashizume, T. Sakurai

   Pages 193-282

10. Adsorption of Fullerenes on Semiconductor and Metal Surfaces Investigated by Field-Ion Scanning Tunneling Microscopy

    • T. Hashizume, T. Sakurai

    Pages 283-338

11. Back Matter

    Pages 339-341

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There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re­ search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.

• AFM
• Adsorption
• Experiment
• Fulleren
• Fullerene
• REM
• STM

• Institute of Materials Research, Tohoku University, Aoba-ku, Sendai, Japan

  Toshio Sakurai, Yousuke Watanabe

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