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Radiation Effects on Integrated Circuits and Systems for Space Applications

  • Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures
  • Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments
  • Includes coverage of the impact of Small Satellites in the space industry

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Table of contents (16 chapters)

  1. Front Matter

    Pages i-ix
  2. Space Environments

    • Marcelo Famá, Jaime Estela
    Pages 1-11
  3. System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs)

    • Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria
    Pages 13-38
  4. Single-Event Effects Test Methods

    • Konstantin Tapero
    Pages 39-60
  5. Microprocessor Testing

    • Heather Quinn
    Pages 83-125
  6. Fault Injection Methodologies

    • Luis Entrena, Mario García-Valderas, Almudena Lindoso, Marta Portela-Garcia, Enrique San Millán
    Pages 127-144
  7. Error Rate Prediction of Applications Implemented in Multi-Core and Many-Core Processors

    • Pablo Ramos, Vanessa Vargas, Raoul Velazco, Nacer-Eddine Zergainoh
    Pages 145-173
  8. Improving Reliability of Multi-/Many-Core Processors by Using NMR-MPar Approach

    • Vanessa Vargas, Pablo Ramos, Jean-Francois Méhaut, Raoul Velazco
    Pages 175-203
  9. System Hardening and Real Applications

    • Michel Pignol
    Pages 205-247
  10. Mitigation Transient Faults by Backward Error Recovery in SRAM-FPGA

    • Fakhreddine Ghaffari, Olivier Romain, Bertrand Granado
    Pages 249-276
  11. Development of a Hardened 150 nm Standard Cell Library

    • João Baptista S. Martins, Jorge Johanny Sáenz Noval
    Pages 277-300
  12. COTS in Space: Constraints, Limitations and Disruptive Capability

    • Michel Pignol, Florence Malou, Corinne Aicardi
    Pages 301-327
  13. COTS and the NewSpace

    • Jaime Estela
    Pages 329-346
  14. COTS for Deep Space Missions

    • Hans-Juergen Sedlmayr, A. Beyer, K. Joehl, K. Kunze, M. Maier, T. Obermeier
    Pages 381-401

About this book

This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects.

  • Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures;
  • Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments;
  • Includes coverage of the impact of Small Satellites in the space industry.

Editors and Affiliations

  • Centre Nationale Recherche Scientifique (CNRS), Grenoble, France

    Raoul Velazco

  • United States Naval Research Laboratory, Washington, DC, USA

    Dale McMorrow

  • Spectrum Aerospace Group, Munich, Germany

    Jaime Estela

About the editors

Raoul Velazco is Director of Research (DR) at CNRS (National Center for Scientific Research) and the Head of the RIS (Robust Integrated Systems) team at TIMA (Techniques of Informatics and Microelectronics for integrated systems Architecture) Laboratory, in Grenoble-France.

Dale McMorrow is Head of the Radiation Effects Section at the US Naval Research Laboratory, in Washington, DC.

Jaime Estela is CEO/CTO, Small-Satellite Technology, at Spectrum Aerospace Group, in Munich-Germering, Germany.

Mr. Jaime Estela is an electronic engineer born in Lima-Peru. He worked at GSOC DLR in Oberpfaffenhofen for more than 11 years. In this period he gathered experience in satellite operations and systems engineering, and supported several LEO satellite missions like Terrasar-X, Tandem-X, Prisma A & B, Grace 1 & 2, CHAMP, BIRD, TET. Mr. Estela was also involved, as Ground Segment Engineer, in the ESA project Columbus, the European Module of the International Space Station (ISS). Furthermore he has supported Nanosatellite missions developed by Universities. He supported the project QB-50, an international constellation of 50 CubeSats which will study the higher ionosphere in a low Earth orbit and during its re-entry as suborbital research platform. In 2010 he founded Spectrum ARC GmbH and served as CEO/CTO. He is currently managing the company Spectrum Aerospace Technologies UG (Munich-Germany) and Spectrum Aerospace Research Corporation S.A.C. (Lima-Peru). Both companies belong to the Spectrum Aerospace Group. Mr. Estela has published and co-authored papers and articles in international journals and conference proceedings. The terminology Space-COTS, its concept and philosophy of qualifying commercial electronics for space applications was invented by Mr. Estela. The research study of Space-COTS, finding the middle point between having no qualified components in opposition to a fully qualified EEE parts.

 


Bibliographic Information

  • Book Title: Radiation Effects on Integrated Circuits and Systems for Space Applications

  • Editors: Raoul Velazco, Dale McMorrow, Jaime Estela

  • DOI: https://doi.org/10.1007/978-3-030-04660-6

  • Publisher: Springer Cham

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer Nature Switzerland AG 2019

  • Hardcover ISBN: 978-3-030-04659-0Published: 25 April 2019

  • eBook ISBN: 978-3-030-04660-6Published: 10 April 2019

  • Edition Number: 1

  • Number of Pages: IX, 401

  • Number of Illustrations: 51 b/w illustrations, 141 illustrations in colour

  • Topics: Circuits and Systems, Signal, Image and Speech Processing, Electronics and Microelectronics, Instrumentation

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access