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Dependability in Electronic Systems

Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

  • Book
  • © 2011

Overview

Authors:
  1. Nobuyasu Kanekawa

    1. Hitachi Research Laboratory, Hitachi, Ltd., Hitachi-shi, Ibaraki, Japan

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  2. Eishi H. Ibe

    1. Hitachi Research Laboratory, Hitachi, Ltd., Yokohama-shi, Kanagawa, Japan

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  3. Takashi Suga

    1. Hitachi Research Laboratory, Hitachi, Ltd., Yokohama-shi, Kanagawa, Japan

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  4. Yutaka Uematsu

    1. Hitachi Research Laboratory, Hitachi, Ltd., Yokohama-shi, Kanagawa, Japan

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  • Provides a set of valuable techniques to design dependability into embedded systems;
  • Describes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applications;
  • Discusses vulnerability in power supply systems and how power integration is accomplished.
  • Includes supplementary material: sn.pub/extras

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Table of contents (6 chapters)

  1. Front Matter

    Pages i-xxv
    Download chapter PDF

  2. Introduction

    • Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
    Pages 1-6

  3. Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems and Their Mitigation Techniques

    • Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
    Pages 7-63

  4. Electromagnetic Compatibility

    • Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
    Pages 65-89

  5. Power Integrity

    • Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
    Pages 91-142

  6. Fault-Tolerant System Technology

    • Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
    Pages 143-200

  7. Challenges in the Future

    • Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
    Pages 201-202

  8. Back Matter

    Pages 203-204
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Keywords

About this book

This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.

Authors and Affiliations

  • Hitachi Research Laboratory, Hitachi, Ltd., Hitachi-shi, Ibaraki, Japan

    Nobuyasu Kanekawa

  • Hitachi Research Laboratory, Hitachi, Ltd., Yokohama-shi, Kanagawa, Japan

    Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

Bibliographic Information

  • Book Title: Dependability in Electronic Systems

  • Book Subtitle: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

  • Authors: Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

  • DOI: https://doi.org/10.1007/978-1-4419-6715-2

  • Publisher: Springer New York, NY

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer Science+Business Media, LLC 2011

  • Hardcover ISBN: 978-1-4419-6714-5

  • Softcover ISBN: 978-1-4899-8594-1

  • eBook ISBN: 978-1-4419-6715-2

  • Edition Number: 1

  • Number of Pages: XXV, 204

  • Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design

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