Authors:
Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 33)
Buy it now
Buying options
Tax calculation will be finalised at checkout
Other ways to access
This is a preview of subscription content, log in via an institution to check for access.
Table of contents (9 chapters)
-
Front Matter
-
Back Matter
About this book
Authors and Affiliations
-
Carnegie Mellon University, USA
Duncan Moore Henry Walker
Bibliographic Information
Book Title: Yield Simulation for Integrated Circuits
Authors: Duncan Moore Henry Walker
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/978-1-4757-1931-4
Publisher: Springer New York, NY
-
eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media Dordrecht 1987
Hardcover ISBN: 978-0-89838-244-0Published: 30 September 1987
Softcover ISBN: 978-1-4419-5201-1Published: 10 December 2010
eBook ISBN: 978-1-4757-1931-4Published: 17 April 2013
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: XII, 209
Topics: Computer-Aided Engineering (CAD, CAE) and Design, Electrical Engineering