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Table of contents (7 chapters)
Keywords
About this book
The first two chapters cover bulk silicon and SOI MOSFETs. The electronic transport in the inversion layer, the influence of impurity freeze-out, the special electrical properties of SOI structures, the device reliability and the interest of a low temperature operation for the ultimate integration of silicon down to nanometer dimensions are described. The next two chapters deal with Silicon-Germanium and III-V Heterojunction Bipolar Transistors, as well as III-V High Electron Mobility Transistors (HEMT). The basic physics of the SiGe HBT and its unique cryogenic capabilities, the optimization of such bipolar devices, and the performance of SiGe HBT BiCMOS technology at liquid nitrogen temperature are examined. The physical effects in III-V semiconductors at low temperature, the HEMT and HBT static, high frequency and noise properties, and the comparison of various cooled III-V devices are also addressed. The next chapter treats quantum effect devices made of silicon materials. The major quantum effects at low temperature, quantum wires, quantum dots as well as single electron devices and applications are investigated. The last chapter overviews the performances of cryogenic circuits and their applications. The low temperature properties and performance of inverters, multipliers, adders, operational amplifiers, memories, microprocessors, imaging devices, circuits and systems, sensors and read-out circuits are analyzed.
Device and Circuit Cryogenic Operation for Low Temperature Electronics is useful for researchers, engineers, Ph.D. and M.S. students working in the field of advanced electron devices and circuits, new semiconductor materials, and low temperature electronics and physics.
Editors and Affiliations
Bibliographic Information
Book Title: Device and Circuit Cryogenic Operation for Low Temperature Electronics
Editors: Francis Balestra, Gérard Ghibaudo
DOI: https://doi.org/10.1007/978-1-4757-3318-1
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media Dordrecht 2001
Hardcover ISBN: 978-0-7923-7377-3Published: 31 May 2001
Softcover ISBN: 978-1-4419-4898-4Published: 03 December 2010
eBook ISBN: 978-1-4757-3318-1Published: 11 November 2013
Edition Number: 1
Number of Pages: VIII, 262
Topics: Electronics and Microelectronics, Instrumentation, Circuits and Systems, Electrical Engineering, Characterization and Evaluation of Materials, Optical and Electronic Materials