Overview
Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry (NAII, volume 186)
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Table of contents (29 papers)
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Front Matter
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Fundamentals of Scanning Probe Techniques
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Application of Scanning Techniques to Functional Materials
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Contributed papers
Keywords
About this book
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Editors and Affiliations
Bibliographic Information
Book Title: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Book Subtitle: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
Editors: Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon
Series Title: NATO Science Series II: Mathematics, Physics and Chemistry
DOI: https://doi.org/10.1007/1-4020-3019-3
Publisher: Springer Dordrecht
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer Science+Business Media B.V. 2005
Hardcover ISBN: 978-1-4020-3017-8Published: 02 March 2005
Softcover ISBN: 978-1-4020-3018-5Published: 21 February 2005
eBook ISBN: 978-1-4020-3019-2Published: 15 June 2006
Series ISSN: 1568-2609
Edition Number: 1
Number of Pages: XXXVII, 488
Topics: Condensed Matter Physics, Optical and Electronic Materials, Nanotechnology, Surfaces and Interfaces, Thin Films