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  • © 1994

System Test and Diagnosis

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Table of contents (15 chapters)

  1. Front Matter

    Pages i-xvi
  2. Motivation

    1. Front Matter

      Pages 1-1
    2. Introduction

      • William R. Simpson, John W. Sheppard
      Pages 3-7
    3. Maintainability: A Historical Perspective

      • William R. Simpson, John W. Sheppard
      Pages 9-18
    4. Field Diagnosis and Repair: The Problem

      • William R. Simpson, John W. Sheppard
      Pages 19-34
  3. Analysis and Application

    1. Front Matter

      Pages 35-35
    2. Bottom-Up Modeling for Diagnosis

      • William R. Simpson, John W. Sheppard
      Pages 37-50
    3. System Level Analysis for Diagnosis

      • William R. Simpson, John W. Sheppard
      Pages 51-64
    4. The Information Flow Model

      • William R. Simpson, John W. Sheppard
      Pages 65-89
    5. System Level Diagnosis

      • William R. Simpson, John W. Sheppard
      Pages 91-138
    6. Evaluating System Diagnosability

      • William R. Simpson, John W. Sheppard
      Pages 139-190
    7. Verification and Validation

      • William R. Simpson, John W. Sheppard
      Pages 191-215
    8. Architectures for System Diagnosis

      • William R. Simpson, John W. Sheppard
      Pages 217-236
  4. Advanced Topics

    1. Front Matter

      Pages 237-237
    2. Inexact Diagnosis

      • William R. Simpson, John W. Sheppard
      Pages 239-266
    3. Partitioning Large Problems

      • William R. Simpson, John W. Sheppard
      Pages 267-294
    4. Modeling Temporal Information

      • William R. Simpson, John W. Sheppard
      Pages 295-323
    5. Adaptive Diagnosis

      • William R. Simpson, John W. Sheppard
      Pages 325-348
    6. Diagnosis—Art versus Science

      • William R. Simpson, John W. Sheppard
      Pages 349-360
  5. Back Matter

    Pages 361-382

About this book

System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail. The ideas presented emphasize that it is possible to diagnose complex systems efficiently. Since the notion of system is hierarchical, these ideas are applicable to all levels.
The philosophy is presented in the context of a model-based approach, using the information flow model, that focuses on the information provided by the tests rather than the functions embedded in the system. Detailed algorithms are offered for evaluating system testability, performing efficient diagnosis, verifying and validating the models, and constructing an architecture for system maintenance. Several advanced algorithms, not commonly available in existing diagnosis tools, are discussed, including reasoning with inexact or uncertain test data, breaking large problems into manageable smaller problems, diagnosing systems with time sensitive information and time dependent tests and learning from experience.
The book is divided into three parts. The first part provides motivation for careful development of the subject and the second part provides the tools necessary for analyzing system testability and computing diagnostic strategies. The third part presents advanced topics in diagnosis.
Several case studies are provided, including a single detailed case study. Smaller case studies describe experiences from actual applications of the methods discussed. The detailed case study walks the reader through a complete analysis of a system to illustrate the concepts and describe the analyses that are possible. All case studies are based upon real systems that have been modeled for the purposes of diagnosis.
System Test and Diagnosis is the culmination of nearly twelve years of research into diagnosis modeling and its applications. It is designed as a primary reference for engineers and practitioners interested in system test and diagnosis.

Authors and Affiliations

  • Institute for Defense Analyses, USA

    William R. Simpson

  • ARINC Research Corporation, USA

    John W. Sheppard

Bibliographic Information

  • Book Title: System Test and Diagnosis

  • Authors: William R. Simpson, John W. Sheppard

  • DOI: https://doi.org/10.1007/978-1-4615-2702-2

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 1994

  • Hardcover ISBN: 978-0-7923-9475-4Published: 31 August 1994

  • Softcover ISBN: 978-1-4613-6163-3Published: 04 October 2012

  • eBook ISBN: 978-1-4615-2702-2Published: 06 December 2012

  • Edition Number: 1

  • Number of Pages: XVI, 382

  • Topics: Circuits and Systems, Electrical Engineering

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access