Overview
- Introduces the thermophysical properties and theory of Ge-Sb-Te alloys
- Describes measuring techniques for thermal conductivity, electrical resistivity, and density
- Studies comprehensively the thermal conductivity and conduction mechanism of Ge-Sb-Te alloys
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Table of contents (7 chapters)
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Front Matter
Keywords
About this book
Authors and Affiliations
About the author
Ms. Rui Lan received the B.S. degree from Department of Material Science and Technology, Dalian University of Technology, Dalian, China in 2005, the M.S. and Ph.D. degrees from Department of Metallurgy and Ceramics Sciences, Tokyo Institute of Technology (TITECH), Japan in 2009 and 2012, respectively. Since 2013, she has been an Associate Professor at Department of Material Science and Technology, Jiangsu University of Science and Technology, Zhenjiang, China. Her research interests include Phase change storage materials, thermoelectric thin film materials, high-entropy alloy coating and semiconductor materials.
Bibliographic Information
Book Title: Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory
Authors: Rui Lan
DOI: https://doi.org/10.1007/978-981-15-2217-8
Publisher: Springer Singapore
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Xi'an Jiaotong University Press 2020
Hardcover ISBN: 978-981-15-2216-1Published: 08 January 2020
Softcover ISBN: 978-981-15-2219-2Published: 08 January 2021
eBook ISBN: 978-981-15-2217-8Published: 07 January 2020
Edition Number: 1
Number of Pages: XI, 139
Number of Illustrations: 56 b/w illustrations, 64 illustrations in colour
Topics: Characterization and Evaluation of Materials, Optical and Electronic Materials, Semiconductors, Materials Engineering, Electronic Circuits and Devices, Phase Transitions and Multiphase Systems